1991 Parkway Blvd.
Salt Lake City, UT 84119 USA
801-973-4600
800-441-9910 toll-free in USA
Email: info@cirris.com
Web: http://www.cirris.com
Cirris Systems Corporation manufacturers a complete line of equipment to assure quality in electrical cable assemblies, wiring harnesses, flex circuits, backplanes, connectors, and other wiring devices. From stand-alone bench top cable testers to PC based wiring analyzers capable of testing over 30,000 points, Cirris has the broadest range of wiring harness testers in the industry.

Cirris Signature 1100H+ Benchtop high voltage cable tester
More than just testers, Cirris’ products can be used to guide cable and harness assembly. Our goal is to help customers move quality assurance as far upstream in the assembly process as possible. Wiring errors caught when and where they occur are much easier and less expensive to correct than errors caught in final test, or worse yet when they are installed in the end product.

easy-wire guided assembly and test
Cirris’ Signature Series are low voltage and high voltage testers that expand from 64 to 1024 test points and range from 5VDC to 2000VDC – 1000VAC capability. They test for continuity, mis-wires, shorts, and can test components such as resistors, diodes, capacitors and can verify proper twisted pairing. Our easy-wire series are PC based harness and backplane testers that offer graphical connectors, step-by-step guided assembly instructions as well as test-on-the board capability. They range from 256 to 30,000+ test points, with low voltage models and high voltage up to 2000VDC and 1500VAC.

easy-wire CH2 high voltage test system
Cirris’ Pin-Sight is a revolutionary tool for military/aerospace wire harness manufacturers. It not only gives on-screen visual guided assembly of inserting wires and seal plugs into connectors, but it forces the operator to perform a “pull back” test on inserted wires, assuring that all wires are properly locked into the connector, elimination push back problems in the field.

Pin-Sight guided pinning tool


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